Summary:
X-link: https://github.com/facebook/react-native/pull/51181
We want to know if an artifact created during measurement can fully be reused after final layout, but the final layout is allowed to be slightly larger due to pixel grid rounding (while still allowing reuse). It's hard to tell after the fact, whether it is larger because of this rounding (though the measure is used), or if it may be a pixel larger for valid reasons.
We can expose the unsnapped dimensions of a node to give us this information, and to correlate measurement artifacts.
This is most of the time the same as the layout's measured dimension, though I don't think it's safe to use this, since anything else measuring the node after could clobber this (I think `YGNodeLayoutGetOverflow` may also be prone to this as a bug).
Changelog: [Internal]
Reviewed By: rshest
Differential Revision: D74292949
